Master's degree in Electrical Engineering, Optics, Physics, or a related field, or equivalent practical experience.
5 years of experience working directly with and recipe development in semiconductor metrology tools including critical dimension (CD), overlay, profilometer, reflectometer, ellipsometer, laser or white light interferometer, surface defect, scanning electron microscope (SEM), atomic force microscope (AFM).
Experience with statistical analysis, interpreting data, identifying trends, performing root cause analysis, and making data-driven decisions.
Preferred qualifications:
Experience working with III-V compound semiconductor and wafer fabrication in manufacturing settings and metrology cassette automation.
Working knowledge of semiconductor failure analysis (FA) techniques.
Proficiency in optical characterization and microscopy techniques.
Ability to learn fast, work independently, and adapt in a fast-paced, changing environment while communicating cross-functionally effectively (e.g., in-person, emails, reports, technical documents).