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Microsoft Senior Test Engineer - Memory Subsystem HBM DDR SRAM 
Malaysia, Penang 
50486175

16.07.2024

Required Qualifications

  • 10+ years of experience in product and test engineering, specialize in ATE test program development
  • 8+ years of experience in developing integrated circuits (pre-silicon, first silicon bring-up, new product introduction).
  • 8+ years’ experience in large scale and/or high performance (i.e., AI, machine leaning, neural nets, CPU’s) and/or high power SoCs/chips on advanced process nodes.

Preferred Qualifications

  • Strong presentation and communication skills.
  • Knowledgeable in DFT and DFM techniques.
  • Good understanding of bring-up/debug, characterization/manufacturing test (on ATEs).
  • Advantest V93K experience is a plus
  • Ability to drive development and bring up test content on mixed signal IP’s is a plus.
  • Strong probability and statistics background including DOE’s.
  • Experience in
    • Leading cross functional teams and understands program/project management.
    • Managing supply chain, vendors / partners, and Integrated Circuit production.
    • Experience in system/customer requirements gathering and interfacing.
  • Device physics background.
  • Experience with failure analysis, qualification, and yield analysis
  • Trusted Computer architecture fundamentals/background
  • Great unit/integration testing skills
  • Fantastic Linux skills
  • Background in debugging and optimizing software
  • Adaptability (responds, explores, constructive attitude)
  • Growth Mindset (It starts with a belief that everyone can grow and develop)
  • Customer Focus (anticipates needs and proactively meets expectations)
  • Drive for results (actively pursues outcome, delivers on commitments)
  • Influence for impact (communicates, networks, persuades, influences)
  • Judgement (scope problem, builds & applies knowledge)
Responsibilities

Product and Test Engineering requires experience in end-to-end pre silicon and post silicon development which covers analog/digital test content development, debug, characterization, low yield debug, and test time improvement.

The position will have the following responsibilities:

  • Expertise in specific/multiple ATE test module for Memory Subsystem which includes HBM, DDR PHY and SRAM.
  • Develop pre silicon validation test plan (in partnership with design) and post silicon test plan for Memory Subsystem.
  • Pre silicon simulation of Memory Subsystem test content usage model and how it gets integrated into ATE flow at wafer and package level.
  • Developing Memory Subsystem ATE test methods and characterization for test modules.
  • Analyzing test data to identify test program or silicon issues and working with cross functional teams to root cause will also be a focus.
  • ATE level failure triage and debug across silicon, hardware, and software.
  • Knowledge of system level tests and memory subsystem’s telemetry is a plus especially when dealing with System level test (SLT) failures and correlation of SLT with ATE test quality.
  • Knowledge of platform, packaging, silicon power management and thermal is a plus and the ability to connect the dots will help in addressing any product quality issues.
  • Experience in dealing with HBM supplier in areas of new technology evaluation, failure analysis, RMA and correlation work.

Making a difference

We fundamentally believe that we need a culture founded in a Growth Mindset. It starts with a belief that everyone can grow and develop; that potential is nurtured, not pre-determined; and that anyone can change their mindset.