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What you'll be doing:
As a member in our team, you will be responsible for the design and implementation of state-of-the-art designs in test access mechanisms, IO BIST, memory BIST and scan compression.
Your responsibility will also include verification and silicon bringup of Scan ATPG and other DFT features.
In addition, you will help develop and deploy DFT methodologies for our next generation products.
Be apart of innovation to strive improve the quality of DFT methods.
You will also need to work with multi-functional teams to incorporate DFT features into the chip.
Occasional travel and also some late hours online meetings involved during critical milestones.
What we need to see:
BSEE or MSEE from reputed institutions or equivalent experience.
3+ years of experience.
You should be well versed with static timing Analysis, ECO, ASIC/Logic Design Flow, HDL and Digital logic design.
Experience in RTL and Gates verification and simulation.
You need to be familiar with BIST architecture andJTAG/IEEE1149.1/IEEE1500.
Strong DFT knowledge in Scan ATPG, compression techniques and memory test.
Strong analytical and problem solving skills.
Strong coding skills in industry standard scripting languages.
Extraordinary written and oral communication skills with the curiosity to work on rare challenges.
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