Product and Test Engineering requires experience in end-to-end pre silicon and post silicon development which covers analog/digital test content development, debug, characterization, low yield debug, and test time improvement.
The position will have the following responsibilities:
- Expertise in specific/multiple ATE test module for Memory Subsystem which includes HBM, DDR PHY and SRAM.
- Develop pre silicon validation test plan (in partnership with design) and post silicon test plan for Memory Subsystem.
- Pre silicon simulation of Memory Subsystem test content usage model and how it gets integrated into ATE flow at wafer and package level.
- Developing Memory Subsystem ATE test methods and characterization for test modules.
- Analyzing test data to identify test program or silicon issues and working with cross functional teams to root cause will also be a focus.
- ATE level failure triage and debug across silicon, hardware, and software.
- Knowledge of system level tests and memory subsystem’s telemetry is a plus especially when dealing with System level test (SLT) failures and correlation of SLT with ATE test quality.
- Knowledge of platform, packaging, silicon power management and thermal is a plus and the ability to connect the dots will help in addressing any product quality issues.
- Experience in dealing with HBM supplier in areas of new technology evaluation, failure analysis, RMA and correlation work.
Making a difference
We fundamentally believe that we need a culture founded in a Growth Mindset. It starts with a belief that everyone can grow and develop; that potential is nurtured, not pre-determined; and that anyone can change their mindset.