Bachelor's degree in Electrical Engineering, Computer Engineering, or equivalent practical experience.
3 years of experience with IC qualification on ATE, data review, production release, test time reduction, and yield improvement.
Experience with ATE IC testing, Yield, and Bin Pareto Analysis.
Preferred qualifications:
Experience with Automatic Test Equipment (ATE) test platforms (e.g., Advantest 93K, Teradyne, UltraFlex, system on a chip (SoC) test system).
Experience with advanced packaging (e.g., process technology), and how it relates to design and testing Data analysis.
Experience with SERDES, PCIe, DDR, and Mixed-Signal circuits (e.g., ADC, DAC, PLL, LDO, and their performance measurements).
Experience with Design for test (DFT) techniques and structural tests (e.g., Scan/ATPG, JTAG and memory BIST), and with testing sensors such as PVT sensors, Temp sensors.
Experience with System Level Testing and using SLT platform.