Bachelor's degree in Electrical Engineering, Computer Engineering, or equivalent practical experience.
3 years of experience with IC qualification on ATE, data review, production release, test time reduction, and yield improvement.
Experience with ATE IC testing, Yield, and Bin Pareto Analysis.
Preferred qualifications:
Experience with OTP (one time programmable/eFuse/antiFuse) for identification, yield improvement, calibration, and security.
Experience with Automatic Test Equipment test platforms (e.g., Advantest 93K, Teradyne, UltraFlex, system on a chip test system).
Experience with object oriented programming (e.g., C++ or Java) and OOP concepts, and familiarity with standard data structures, version control (e.g., GIT, SVN), code reviews.
Experience with SERDES, PCIe, DDR, and Mixed-Signal circuits (e.g., ADC, DAC, PLL, LDO, and their performance measurements).
Experience with DFT techniques and structural tests (e.g., Scan/ATPG, JTAG and memory BIST), and with testing sensors, e/g, PVT/Temp sensors.