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Defect Metrology Application Engineer:
This position is within the process diagnostics and control (PDC) group, which deals with advanced imaging together with cutting edge image processing algorithms in order to detect, measure and classify nanometer size defects from semiconductor fabrication process steps.At a higher expertise level, they also contribute to product development roadmap through spec definition and performance validation.
Desired capabilities:
1.Sound fundamentals of high-NA DUV imaging/SEM andlight-matter/electron-matterinteraction3.Lab/fab hands-on experience in semiconductor fabrication with layer-wise detailed knowledge of material, process tech and defectivity
4.Detail oriented with strong analytical, problem solving and communication skills
Functional Knowledge
Business Expertise
Leadership
Problem Solving
Impact
Interpersonal Skills
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