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Defect Metrology Application Engineer:
This position is within the process diagnostics and control (PDC) group, which deals with advanced imaging together with cutting edge image processing algorithms in order to detect, measure and classify nanometer size defects from semiconductor fabrication process steps.
At a higher expertise level, they also contribute to product development roadmap through spec definition and performance validation.
Desired qualification:
1.Sound fundamentals of high-NA DUV imaging/SEM andlight-matter/electron-matterinteraction
3.Lab/fab hands-on experience in semiconductor fabrication with layer-wise detailed knowledge of material, process tech and defectivity
4.Detail oriented with strong analytical, problem solving and communication skills
5.Ability to work in a team, and ability to work independently
Bachelor's Degree1 - 2 YearsFull timeAssignee / Regularמשרות נוספות שיכולות לעניין אותך