Applied Materials Defect Metrology Application Engineer 

India, Karnataka 

390113903

This position is within the process diagnostics and control (PDC) group, which deals with advanced imaging together with cutting edge image processing algorithms in order to detect, measure and classify nanometer size defects from semiconductor fabrication process steps.

At a higher expertise level, they also contribute to product development roadmap through spec definition and performance validation.

Desired qualifications:

• Sound fundamentals of high-NA DUV imaging/SEM andlight-matter/electron-matterinteraction
• Open to 70% travel to leading semiconductor chip manufacturing fabs overseas
• Lab/fab hands-on experience in semiconductor fabrication with layer-wise detailed knowledge of material, process tech and defectivity
• Detail oriented with strong analytical, problem solving and communication skills
• Ability to work in a team, and ability to work independently

Functional Knowledge

Demonstrates expanded conceptual knowledge in own discipline and broadens capabilities

No supervisory responsibilities but provides informal guidance to new team members

Problem Solving

Solves problems in straightforward situations; analyzes possible solutions using technical experience and judgment and precedents

Interpersonal Skills

Explains complex information to others in straightforward situations

Master's Degree: Metallurgical Engineering (Required)

1 - 2 Years

Full time

Assignee / Regular